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Xstress Mini
Complete X-ray diffractometer now in a single, compact and portable unit
The Xstress Mini is the smallest X-ray diffraction analyzer in the Xstress -product line. The Xstress Mini is lightweight can be used to measure residual stresses for quality and process control. This unit is easily portable and ideal for measurements on-site, at the factory, or in the laboratory.
- Fast, accurate, and repeatable analysis of crystalline materials
- Quick and easy set up to expedite your measurement process and analysis
- Box-like shape with a footprint smaller than a laptop
Technical specifications
- Two NMOS position sensitive detectors, two beam X-ray output.
- Single shot: two exposures measured simultaneously.
- χ measurement mode.
- Cr X-ray tube: Max output 30 kV/1.6 mA/48 W
- Replaceable collimator, to provide 1−5 mm spot sizes. Special collimators available as an option.
- Air cooled system.
- Universal power input 110−230 V AC 50−60 Hz, battery option
- D170 x W190 x H270 mm