Xstress Mini > STRESSTECH

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Shinhan Scientific Testing Instrument

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Xstress Mini

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Xstress Mini

Complete X-ray diffractometer now in a single, compact and portable unit

The Xstress Mini is the smallest X-ray diffraction analyzer in the Xstress -product line. The Xstress Mini is lightweight can be used to measure residual stresses for quality and process control. This unit is easily portable and ideal for measurements on-site, at the factory, or in the laboratory.

  • Fast, accurate, and repeatable analysis of crystalline materials
  • Quick and easy set up to expedite your measurement process and analysis
  • Box-like shape with a footprint smaller than a laptop

Xstress Mini applications

 

Technical specifications
  • Two NMOS position sensitive detectors, two beam X-ray output.
  • Single shot: two exposures measured simultaneously.
  • χ measurement mode.
  • Cr X-ray tube: Max output 30 kV/1.6 mA/48 W
  • Replaceable collimator, to provide 1−5 mm spot sizes. Special collimators available as an option.
  • Air cooled system.
  • Universal power input 110−230 V AC 50−60 Hz, battery option
  • D170 x W190 x H270 mm

 

 

Company name : Shinhan Scientific Testing Instrument Co., Ltd. (SSTI)  l  CEO : 허창영(Chang Young Hur)
[Headquarter] Address : A601 ho, Hagye Techno Town, 10 Nowon-ro 15 gil, Nowon-gu, Seoul 01788, Korea  l   Tel : 82-2-973-5300  l  Fax : 82-2-973-9989  l  E-mail : info@shin-hanti.com
[South A/S Center] Address : 901 Room, 56, Yongi-ro Seongsan-gu, Changwon-si, Gyeongsangnam-do, 51522, Korea   l   Tel : 055-285-9576  l  Fax : 055-285-9577
[Demo Room] Address : 112 Room, 56, Yongi-ro Seongsan-gu, Changwon-si, Gyeongsangnam-do, 51522, Korea
Copyright © 2017 Shinhan Scientific Testing Instrument Co., Ltd. All Rights Reserved.